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General Information
    • ISSN: 2010-3719 (Online)
    • Abbreviated Title: Int. J. Inf. Electron. Eng.
    • Frequency: Quarterly
    • DOI: 10.18178/IJIEE
    • Editor-in-Chief: Prof. Chandratilak De Silva Liyanage
    • Executive Editor: Jennifer Zeng
    • Abstracting/ Indexing : Google Scholar, Electronic Journals Library, Crossref and ProQuest,  INSPEC (IET), EBSCO, CNKI.
    • E-mail ijiee@ejournal.net
Editor-in-chief

 
University of Brunei Darussalam, Brunei Darussalam   
" It is a great honor to serve as the editor-in-chief of IJIEE. I'll work together with the editorial team. Hopefully, The value of IJIEE will be well recognized among the readers in the related field."

IJIEE 2014 Vol.4(3): 209-215 ISSN: 2010-3719
DOI: 10.7763/IJIEE.2014.V4.436

Proposal for a New Artifact-Metrics Method (Application to Valuable Pottery, Porcelain and Glass Products)

Masaki Fujikawa, Fumihiko Oda, Kengo Moriyasu, Shingo Fuchi, and Yoshikazu Takeda
Abstract— The authors propose a new method in which the fact that a pottery or porcelain product is actually produced by the brand-holder company or by the ceramic artist (authenticity) can be easily verified, and at the same time, production of counterfeit products becomes difficult. The artifact-metrics are used in this method and as the material used in the method is transparent, the patterns and color tone created by the master artisan or ceramic artist are not affected. As the material is applied on to the product in the process of enameling or glazing, no additional work process is required for the master artisan or ceramic artist must take. Furthermore, because the method does not require UV rays or radioactive rays in registration and verification of products, potential hazards to the human body or product are eliminated, and no special skill is required in verification of authenticity. In this report, the authors indicate high feasibility of this method by showing results of elementary experiments.

Index Terms— Artifact-metrics, authenticity verification, glass phosphor, infrared image processing.

M. Fujikawa is with the Sohgo Security Services Co., Ltd, Koto-ku, Tokyo 135-0014, Japan (e-mail: fujikawa-masaki@alsok.co.jp).
F. Oda and K. Moriyasu are with the Ushio Inc, Himeji, Hyogo Pref., 671-0224, Japan.
S. Fuchi is with the Aoyama Gakuin University, Sagamihara, Kanagawa Pref., 252-5258, Japan.
Y. Takeda is with the Nagoya University, Nagoya, Aichi Pref., 464-8603, Japan.

[PDF]

Cite: Masaki Fujikawa, Fumihiko Oda, Kengo Moriyasu, Shingo Fuchi, and Yoshikazu Takeda, " Proposal for a New Artifact-Metrics Method (Application to Valuable Pottery, Porcelain and Glass Products)," International Journal of Information and Electronics Engineering vol. 4, no. 3, pp. 209-215, 2014.

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