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General Information
    • ISSN: 2010-3719
    • Frequency: Bimonthly
    • DOI: 10.18178/IJIEE
    • Editor-in-Chief: Prof. Chandratilak De Silva Liyanage
    • Associate Executive Editor: Ms. Jennifer Zeng
    • Executive Editor: Mr. Ron C. Wu
    • Abstracting/ Indexing : Google Scholar, Electronic Journals Library, Crossref and ProQuest, Ei (INSPEC, IET).
    • E-mail ijiee@ejournal.net

Faculty of Science, University of Brunei Darussalam, Brunei Darussalam   
" It is a great honor to serve as the editor-in-chief of IJIEE. I'll work together with the editorial team. Hopefully, IJIEE will be recognized among the readers in the related field."
IJIEE 2015 Vol.5(1): 27-30 ISSN: 2010-3719
DOI: 10.7763/IJIEE.2015.V5.495

Traditional Method and Multi-Taper to Feature Extraction Using Mel Frequency Cepstral Coefficients

Jose Trangol and Abel Herrera
Abstract— This paper makes a comparison of two methods in speech processing that aims to obtain cepstral coefficients that represent characteristics of each speaker, in order to obtain a greater difference between each speaker (to build a representative model, in a next step), traditionally feature extraction is performed through a single periodic window function (generally hamming windows), we compare the traditional method with multi-taper, which has been used in verification speakers tasks and language recognition. The results obtained using 40 speakers indicate a reduction of the variance by using multi-taper and better separation between speakers; with this we have more robust coefficients. To feature extractions we use Mel Frequency Cepstral Coefficients.

Index Terms— Feature extraction, mel frequency cepstral coefficients, multi-taper.

Jose Trangol and Abel Herrera are with Department of Signal Processing, Engineering School, Universidad Nacional Autonoma de Mexico, Mexico (e-mail: abelherrerac1@gmail.com).


Cite: Jose Trangol and Abel Herrera, " Traditional Method and Multi-Taper to Feature Extraction Using Mel Frequency Cepstral Coefficients," International Journal of Information and Electronics Engineering vol. 5, no. 1, pp. 27-30, 2015.

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