• Aug 06, 2019 News!IJIEE Vol. 9, No. 3 issue has been published online!   [Click]
  • Jun 04, 2019 News!IJIEE Vol. 9, No. 2 issue has been published online!   [Click]
  • May 14, 2019 News!Vol.7, No.5-Vol.8, no.2 has been indexed by EI (Inspec).   [Click]
General Information
    • ISSN: 2010-3719 (Online)
    • Abbreviated Title: Int. J. Inf. Electron. Eng.
    • Frequency: Quarterly
    • DOI: 10.18178/IJIEE
    • Editor-in-Chief: Prof. Chandratilak De Silva Liyanage
    • Executive Editor: Jennifer Zeng
    • Abstracting/ Indexing : Google Scholar, Electronic Journals Library, Crossref and ProQuest, Ei (INSPEC, IET), EBSCO.
    • E-mail ijiee@ejournal.net
Editor-in-chief

 
University of Brunei Darussalam, Brunei Darussalam   
" It is a great honor to serve as the editor-in-chief of IJIEE. I'll work together with the editorial team. Hopefully, The value of IJIEE will be well recognized among the readers in the related field."

IJIEE 2015 Vol.5(2): 84-87 ISSN: 2010-3719
DOI: 10.7763/IJIEE.2015.V5.507

A Proposal of a Hamming Distance Detector with a Neuron CMOS A/D Converter

Makoto Urakami, Masaaki Fukuhara, and Masahiro Yoshida
Abstract— In this paper, we propose a new Hamming distance detector using a neuron CMOS A/D converter with two output terminals. The detector outputs the signals which are corresponding to the Hamming distance between two input data immediately. The FPD method is applied to design the ratio of each input capacitance of the proposed detector. To verify the behavior of the proposed detector, the computer simulations were carried out by LTspice.

Index Terms— A/D converter, hamming distance detector, neuron MOS.

The authors are with the Tokai University, Tokyo Japan (e-mail: 4bjnm006@mail.tokai-u.jp, fukuhara@tokai.ac.jp, yoshida@tokai.ac.jp).

[PDF]

Cite: Makoto Urakami, Masaaki Fukuhara, and Masahiro Yoshida, " A Proposal of a Hamming Distance Detector with a Neuron CMOS A/D Converter," International Journal of Information and Electronics Engineering vol. 5, no. 2, pp. 84-87, 2015.

Copyright © 2008-2019. International Journal of Information and Electronics Engineering. All rights reserved.
E-mail: ijiee@ejournal.net