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General Information
    • ISSN: 2010-3719 (Online)
    • Abbreviated Title: Int. J. Inf. Electron. Eng.
    • Frequency: Quarterly
    • DOI: 10.18178/IJIEE
    • Editor-in-Chief: Prof. Chandratilak De Silva Liyanage
    • Executive Editor: Jennifer Zeng
    • Abstracting/ Indexing : Google Scholar, Electronic Journals Library, Crossref and ProQuest,  INSPEC (IET), EBSCO, CNKI.
    • E-mail ijiee@ejournal.net
Editor-in-chief

 
University of Brunei Darussalam, Brunei Darussalam   
" It is a great honor to serve as the editor-in-chief of IJIEE. I'll work together with the editorial team. Hopefully, The value of IJIEE will be well recognized among the readers in the related field."

IJIEE 2015 Vol.5(6): 460-463 ISSN: 2010-3719
DOI: 10.7763/IJIEE.2015.V5.579

Information Hiding: A New Multi Watermark Algorithm Using Radon Transformation

Omer Siddik and Ersin Elbasi
Abstract— There are basically two approaches to embed a watermark in a multimedia element: spatial domain and transform domain watermarking. In the spatial domain, the watermark is embedded by modifying the pixel values in the original image. Transform domain watermarking is similar to spatial domain watermarking; in this case, the coefficients of transforms such as Discrete Cosine Transform (DCT), Discrete Fourier Transform (DFT) or Discrete Wavelet Transform (DWT) are modified. In this research work we used Radon Transformation (RT) in binary image watermarking. Experimental results show that this new algorithm gives very promising results for geometric attacks.

Index Terms— Copyright protection, discrete wavelet transformation, radon transformation, watermarking.

Omer Siddik is with the Cankaya University, Ankara, Turkey (e-mail: omersubhi87@yahoo.com).
Ersin Elbasi was with TUBITAK. He is now with the Department of Digital Game Design, IPEK University, Turkey (e-mail: eelbasi@ipek.edu.tr).

[PDF]

Cite: Omer Siddik and Ersin Elbasi, " Information Hiding: A New Multi Watermark Algorithm Using Radon Transformation," International Journal of Information and Electronics Engineering vol. 5, no. 6, pp. 460-463, 2015.

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