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General Information
    • ISSN: 2010-3719
    • Frequency: Quarterly
    • DOI: 10.18178/IJIEE
    • Editor-in-Chief: Prof. Chandratilak De Silva Liyanage
    • Associate Executive Editor: Ms. Jennifer Zeng
    • Executive Editor: Mr. Ron C. Wu
    • Abstracting/ Indexing : Google Scholar, Electronic Journals Library, Crossref and ProQuest, Ei (INSPEC, IET).
    • E-mail ijiee@ejournal.net

Faculty of Science, University of Brunei Darussalam, Brunei Darussalam   
" It is a great honor to serve as the editor-in-chief of IJIEE. I'll work together with the editorial team. Hopefully, IJIEE will be recognized among the readers in the related field."
IJIEE 2016 Vol.6(2): 105-109 ISSN: 2010-3719
DOI: 10.18178/IJIEE.2016.6.2.604

Fundamental Approach in Defining Optical Crosstalk

Armien John I. Samson
Abstract—In this paper, a more fundamental approach is used in defining optical crosstalk. This is achieved by analyzing the contributions of the non-interacting terms in the probability distribution of detection. Ideally, the detector registers the photons from the source field if and only if an interaction between the source field and the detector occurs. However, there are terms in the probability distribution that suggests that detection occur even when the detector atoms do not interact with the source photons. This is interpreted as the sources of optical crosstalk and it can be argued that these sources of optical crosstalk are due to (a) the secondary photon emission occurring in the bulk of the material which can either be coming directly from the incident photons or from the thermal excitations of the detector atoms; and (b) the interaction of the detector with the vacuum field.

Index Terms—Optical crosstalk, optical sensors, photon detection.

A. J. Samson is with the QA Department of ams Asia Inc., he is also with the De La Salle University, Manila, Philippines (e-mail: Armien-John.Samson@ams.com).


Cite:Armien John I. Samson, "Fundamental Approach in Defining Optical Crosstalk," International Journal of Information and Electronics Engineering vol. 6, no. 2, pp. 105-109, 2016.

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