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General Information
    • ISSN: 2010-3719 (Online)
    • Frequency: Quarterly
    • DOI: 10.18178/IJIEE
    • Editor-in-Chief: Prof. Chandratilak De Silva Liyanage
    • Executive Editor: Jennifer Zeng
    • Abstracting/ Indexing : Google Scholar, Electronic Journals Library, Crossref and ProQuest, Ei (INSPEC, IET), EBSCO.
    • E-mail ijiee@ejournal.net

University of Brunei Darussalam, Brunei Darussalam   
" It is a great honor to serve as the editor-in-chief of IJIEE. I'll work together with the editorial team. Hopefully, The value of IJIEE will be well recognized among the readers in the related field."

IJIEE 2016 Vol.6(4): 214-220 ISSN: 2010-3719
DOI: 10.18178/IJIEE.2016.6.4.627

An Overview of Pilot Decontamination Methods in TDD Massive MIMO Systems

Sajjad Ali, Zhe Chen, and Fuliang Yin
Abstract—The fundamental premises of massive multiple-input multiple-output (MIMO) communication systems are to deploy antenna arrays with a few hundred antennas at each base station and to serve a much smaller number of single-antenna terminals using multi-user MIMO transmission. Massive MIMO is an enabler for the development of future broadband wireless networks that scales up the advantages of MIMO by orders of magnitude. While massive MIMO renders many implementation issues, linked to channel estimation, detection and precoding schemes. This paper focuses on the impact of pilot contamination on massive MIMO systems caused by the use of non-orthogonal pilot sequences by the users in adjacent cells and presents an overview of the pilot contamination concept and contemporary research on the issue.

Index Terms—Massive MIMO, multi-user MIMO, pilot contamination, precoding.

The authors are with the School of Information and Communication Engineering, Dalian University of Technology, Dalian 116203, China (e-mail: sajjad.ali@mail.dlut.edu.cn, zhechen@dlut.edu.cn, flyin@dlut.edu.cn).


Cite:Sajjad Ali, Zhe Chen, and Fuliang Yin, "An Overview of Pilot Decontamination Methods in TDD Massive MIMO Systems," International Journal of Information and Electronics Engineering vol. 6, no. 4, pp. 214-220, 2016.

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