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General Information
    • ISSN: 2010-3719 (Online)
    • Abbreviated Title: Int. J. Inf. Electron. Eng.
    • Frequency: Quarterly
    • DOI: 10.18178/IJIEE
    • Editor-in-Chief: Prof. Chandratilak De Silva Liyanage
    • Executive Editor: Jennifer Zeng
    • Abstracting/ Indexing : Google Scholar, Electronic Journals Library, Crossref and ProQuest,  INSPEC (IET), EBSCO, CNKI.
    • E-mail ijiee@ejournal.net
Editor-in-chief

 
University of Brunei Darussalam, Brunei Darussalam   
" It is a great honor to serve as the editor-in-chief of IJIEE. I'll work together with the editorial team. Hopefully, The value of IJIEE will be well recognized among the readers in the related field."

IJIEE 2016 Vol.6(6): 331-336 ISSN: 2010-3719
DOI: 10.18178/IJIEE.2016.6.6.649

Development of DFT Based MATLAB and LABVIEW Models for Phasor Measurements

Alok Jain and M. K. Verma
Abstract—With the advent of Phasor Measurement Units (PMUs), it has become quite possible to monitor and control power system networks in real time. PMUs are able to provide time stamped measurements of voltage and current phasors using Global Positioning System (GPS) satellites, in microseconds. Different phasor estimation techniques such as Fast Fourier transform (FFT), Discrete Fourier transform (DFT) may be used by PMUs to estimate phasors. In this paper, MATLAB and LABVIEW models of PMU have been developed to estimate phasors. Proposed models consider use of DFT using non-recursive as well as recursive algorithms. MATLAB based model has been shown to take less time compared to LABVIEW based model.

Index Terms—Discrete Fourier Transform (DFT), Phasor measurement unit (PMU), wide area monitoring system (WAMS).

Alok Jain and M. K. Verma are with the Department of Electrical Engineering, Indian Institute of Technology, (BHU), Varanasi 221005, India (e-mail: alok.rs.eee14@itbhu.ac.in, mkverma.eee@iitbhu.ac.in).

[PDF]

Cite:Alok Jain and M. K. Verma, "Development of DFT Based MATLAB and LABVIEW Models for Phasor Measurements," International Journal of Information and Electronics Engineering vol. 6, no. 6, pp. 331-336, 2016.

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