• Aug 06, 2019 News!IJIEE Vol. 9, No. 3 issue has been published online!   [Click]
  • Jun 04, 2019 News!IJIEE Vol. 9, No. 2 issue has been published online!   [Click]
  • May 14, 2019 News!Vol.7, No.5-Vol.8, no.2 has been indexed by EI (Inspec).   [Click]
General Information
    • ISSN: 2010-3719 (Online)
    • Abbreviated Title: Int. J. Inf. Electron. Eng.
    • Frequency: Quarterly
    • DOI: 10.18178/IJIEE
    • Editor-in-Chief: Prof. Chandratilak De Silva Liyanage
    • Executive Editor: Jennifer Zeng
    • Abstracting/ Indexing : Google Scholar, Electronic Journals Library, Crossref and ProQuest, Ei (INSPEC, IET), EBSCO.
    • E-mail ijiee@ejournal.net

University of Brunei Darussalam, Brunei Darussalam   
" It is a great honor to serve as the editor-in-chief of IJIEE. I'll work together with the editorial team. Hopefully, The value of IJIEE will be well recognized among the readers in the related field."

IJIEE 2019 Vol.9(1): 30-33 ISSN: 2010-3719
DOI: 10.18178/IJIEE.2019.9.1.700

Investigation on Optimum Parameters of Six-Port Reflectometers

Kamil Staszek
Abstract—In this paper a general investigation on the uncertainty of reflection coefficient measurements with the use of six-port reflectometer is presented. A wide range of both power measurement uncertainty and limited dynamics of the power meters utilized in the six-port systems are incorporated. Based on the conducted analysis the optimum parameters of six-port reflectometer are derived, which provide the lowest possible measurement uncertainty distribution for all reflection coefficients of passive devices.

Index Terms—Multiport measurement technique, six-port reflectometer, reflection coefficient, measurement uncertainty, power meters, dynamics of power range.

The author is with AGH University of Science and Technology, Krakow, Poland (e-mail: kamil.staszek@agh.edu.pl).


Cite: Kamil Staszek, "Investigation on Optimum Parameters of Six-Port Reflectometers," International Journal of Information and Electronics Engineering vol. 9, no. 1, pp. 30-33, 2019.

Copyright © 2008-2019. International Journal of Information and Electronics Engineering. All rights reserved.
E-mail: ijiee@ejournal.net