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General Information
    • ISSN: 2010-3719 (Online)
    • Abbreviated Title: Int. J. Inf. Electron. Eng.
    • Frequency: Quarterly
    • DOI: 10.18178/IJIEE
    • Editor-in-Chief: Prof. Chandratilak De Silva Liyanage
    • Executive Editor: Jennifer Zeng
    • Abstracting/ Indexing : Google Scholar, Electronic Journals Library, Crossref and ProQuest, Ei (INSPEC, IET), EBSCO.
    • E-mail ijiee@ejournal.net
Editor-in-chief

 
University of Brunei Darussalam, Brunei Darussalam   
" It is a great honor to serve as the editor-in-chief of IJIEE. I'll work together with the editorial team. Hopefully, The value of IJIEE will be well recognized among the readers in the related field."

IJIEE 2019 Vol.9(3): 67-71 ISSN: 2010-3719
DOI: 10.18178/IJIEE.2019.9.3.708

Measurement of Smart Technology Capability for Manufacturing Fields in a Smart Technology Environment

Chui Young Yoon
Abstract—In a smart technology world, manufacturing fields have established their smart technology environment appropriate for its manufacturing fields in order to reinforce its manufacturing efficiency and competitiveness. The smart technology ability of manufacturing fields is very crucial for the innovative production and operation activities, and for efficient enhancement of the manufacturing performance. A scientific measurement framework has been asked to efficiently gauge smart technology capability of manufacturing fields in order to effectively manage and enlarge its smart technology capability. The developed measurement scale for smart technology ability of manufacturing fields is verified by reliability analysis and factor analysis based on previous literature. This study presents an 11-item measurement tool that can examine the smart technology capability of manufacturing fields in a smart technology environment.

Index Terms—Smart technology, smart technology capability, measurement factor and item, measurement tool.

C. Y. Yoon is with On Kwang Co. Ltd. research center, Cheongju, Chungbuk, 28576, South Korea (e-mail: yoon0109@ ut.ac.kr).

[PDF]

Cite:Chui Young Yoon, "Measurement of Smart Technology Capability for Manufacturing Fields in a Smart Technology Environment," International Journal of Information and Electronics Engineering vol. 9, no. 3, pp. 67-71, 2019.

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