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General Information
    • ISSN: 2010-3719
    • Frequency: Quarterly
    • DOI: 10.18178/IJIEE
    • Editor-in-Chief: Prof. Chandratilak De Silva Liyanage
    • Associate Executive Editor: Ms. Jennifer Zeng
    • Executive Editor: Mr. Ron C. Wu
    • Abstracting/ Indexing : Google Scholar, Electronic Journals Library, Crossref and ProQuest, Ei (INSPEC, IET).
    • E-mail ijiee@ejournal.net

Faculty of Science, University of Brunei Darussalam, Brunei Darussalam   
" It is a great honor to serve as the editor-in-chief of IJIEE. I'll work together with the editorial team. Hopefully, IJIEE will be recognized among the readers in the related field."
IJIEE 2012 Vol.2(2): 264-268 ISSN: 2010-3719
DOI: 10.7763/IJIEE.2012.V2.95

Estimation of RC Global Interconnect Slew in 0.18μm Technology Using Inverse Gamma Distribution Function

Vikas Maheshwari, Sumita Gupta, V. Satyanarayana, R. Kar, D. Mandal, A. K. Bhattacharjee

Abstract—As the technology is shrinking towards the ultra deep sub micrometer regime, timing verification of digital integrated circuits becomes an extremely difficult task due to statistical variations in the gate and wire delays. Statistical timing analysis techniques are being developed to tackle this problem. The variations of critical dimensions in modern VLSI technologies lead to variability in interconnect performance that must be fully accounted for the timing verification. However, handling a multitude of inter-die/intra-die variations and assessing their impacts on circuit performances can dramatically complicate the timing analysis. For optimizations like physical synthesis and static timing analysis, efficient interconnect delay and slew computation is critical. Slew indicates the rate of change of input and output signals. Slew rate determines the ability of a device to handle the varying signals. Determination of slew rate to a good proximity is thus very much essential for efficient design of high speed CMOS integrated circuits as the increase in waveform slew directly enhances the delay of the interconnections. This work presents an accurate and efficient model to compute the slew metric of on-chip interconnect of high speed CMOS circuits. Our slew metric assumption is based on the Inverse Gamma Distribution Function. The inverse gamma distribution is used to characterize the normalized homogeneous portion of the step response. For a generalized RC interconnect model, the stability of the Inverse Gamma Distribution model is guaranteed. The accuracy is proved by comparing our approach with the established methods and SPICE results. It is shown that our approach could result an error in slew calculation as low as 1% with lower value of driver resistance when compared with the SPICE results.

Index Terms—Moment matching, on-chip interconnect, probability distribution function, slew calculation, VLSI.

Vikas Maheshwari is with the ECE Department, Anand Engineering College, Agra, U.P., India (e-mail: maheshwarivikas1982@gmail.com).
Sumita Gupta is with the ECE Department, H.I.T.M Agra, (formally known as BMAS Engineering College), Agra, U.P., India (e-mail:sumitagupta128@gmail.com).
V. Satyanarayana is with LG Electronics India Pvt. Ltd, Greater Noida, U. P., India (e-mail: v1.satyanarayana@lge.com).
R. Kar, D. Mandal, and A. K. Bhattacharjee are with the Department of ECE, National Institute of Technology, Durgapur-9, West Bengal, India(e-mail: rajibkarece@gmail.com).


Cite: Vikas Maheshwari, Sumita Gupta, V. Satyanarayana, R. Kar, D. Mandal, A. K. Bhattacharjee, "Estimation of RC Global Interconnect Slew in 0.18μmTechnology Using Inverse Gamma Distribution Function," International Journal of Information and Electronics Engineering vol. 2, no. 2, pp. 264-268, 2012.

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