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General Information
    • ISSN: 2010-3719
    • Frequency: Bimonthly
    • DOI: 10.18178/IJIEE
    • Editor-in-Chief: Prof. Chandratilak De Silva Liyanage
    • Associate Executive Editor: Ms. Jennifer Zeng
    • Executive Editor: Mr. Ron C. Wu
    • Abstracting/ Indexing : Google Scholar, Electronic Journals Library, Crossref and ProQuest, Ei (INSPEC, IET).
    • E-mail ijiee@ejournal.net
Editor-in-chief

 
Faculty of Science, University of Brunei Darussalam, Brunei Darussalam   
" It is a great honor to serve as the editor-in-chief of IJIEE. I'll work together with the editorial team. Hopefully, IJIEE will be recognized among the readers in the related field."
IJIEE 2013 Vol.2(6): 879-881 ISSN: 2010-3719
DOI: 10.7763/IJIEE.2012.V2.231

Characterization of Silicon Electro-Optical Modulator for Analog Optical Links

Xianshu Luo, Junfeng Song, Xiaoguang Tu, Tsung-Yang Liow, Qing Fang, Mingbin Yu, and Guo-Qiang Lo

Abstract—We investigate the analog performances of a silicon Mach-Zehnder interferometer electro-optical modulator. We characterize the optical responses upon various DC and RF voltage supplies. We also measured the spur-free dynamic range (SFDR) of the modulator using two-tone method, showing maximum SFDR of 40dBc and 46dBc respectively for second harmonic distortion and third-order intermodulation distortion.

Index Terms—MZI modulator, slope efficiency, spur-free dynamic range, silicon integrated device.

Xianshu Luo, Junfeng Song, Xiaoguang Tu, Tsung-Yang Liow, Qing Fang, Mingbin Yu, and Guo-Qiang Lo are with the Institute of Microelectronics, A*STAR (e-mail: luox@ime.a-star.edu.sg)
Junfeng Song is also with State Key Laboratory on Integrated Opto-Electronics, College of Electronic Science and Engineering, Jilin University, Changchun, People’s Republic of China, 130021.

[PDF]

Cite: Xianshu Luo, Junfeng Song, Xiaoguang Tu, Tsung-Yang Liow, Qing Fang, Mingbin Yu, and Guo-Qiang Lo, "Characterization of Silicon Electro-Optical Modulator for Analog Optical Links," International Journal of Information and Electronics Engineering vol. 2, no. 6, pp. 879-881, 2012.

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