Measurement and Characterization of FET Devices Using EKV Parameters Applied to POSFET Sensors . International Journal of Information and Electronics Engineering, [S. l.], v. 3, n. 6, p. 563–566, 2013. Disponível em: https://www.ijiee.org/index.php/ijiee/article/view/746. Acesso em: 27 aug. 2026.