Proposal for a New Artifact-Metrics Method (Application to Valuable Pottery, Porcelain and Glass Products) . International Journal of Information and Electronics Engineering, [S. l.], v. 4, n. 3, p. 209–215, 2014. Disponível em: https://www.ijiee.org/index.php/ijiee/article/view/569. Acesso em: 29 aug. 2026.