PLAGIARISM CHECKER FOR ACADEMIC PROJECT ABSTRACTS. International Journal of Information and Electronics Engineering, [S. l.], v. 15, n. 4, p. 543–551, 2025. DOI: 10.48047/hsq7h845. Disponível em: https://www.ijiee.org/index.php/ijiee/article/view/872. Acesso em: 2 sep. 2026.