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General Information
    • ISSN: 2010-3719
    • Frequency: Bimonthly
    • DOI: 10.18178/IJIEE
    • Editor-in-Chief: Prof. Chandratilak De Silva Liyanage
    • Associate Executive Editor: Ms. Jennifer Zeng
    • Executive Editor: Mr. Ron C. Wu
    • Abstracting/ Indexing : Google Scholar, Electronic Journals Library, Crossref and ProQuest, Ei (INSPEC, IET).
    • E-mail ijiee@ejournal.net

Faculty of Science, University of Brunei Darussalam, Brunei Darussalam   
" It is a great honor to serve as the editor-in-chief of IJIEE. I'll work together with the editorial team. Hopefully, IJIEE will be recognized among the readers in the related field."
IJIEE 2014 Vol.4(1): 67-69 ISSN: 2010-3719
DOI: 10.7763/IJIEE.2014.V4.410

Semianalytic BER Estimation of SC-QPSK under Nakagami-m Frequency Selective Fading Channel with Diversity Reception

Abhijit Bhattacharyya and Neetu Sood
Abstract— Semianalytic estimation of bit-error-rate (BER) is one of the efficient procedures for evaluating BER for modulation formats having circular constellation with noise component of the decision variable is circularly symmetric with Gaussian distribution. To ensure very rapid simulation run time analytical and simulation techniques are used together unlike conventional Monte Carlo simulation. This technique is demonstrated to estimate BER of SC-QPSK system under Nakagami-m frequency selective fading channel. Finally error rate estimation is extended to system having multiple channel reception using spatial diversity combiners. Our result shows that system performance degrades with increasing value of system parameter.

Index Terms— Bit error rate, single carrier–QPSK, Nakgami-m fading channel, diversity.

The authors are with Dept. of Electronics and Communication Engineering, National Institute of Technology, Jalandhar, India (e-mail: abhijit9800@gmail.com, soodn@nitj.ac.in).


Cite: Abhijit Bhattacharyya and Neetu Sood, " Semianalytic BER Estimation of SC-QPSK under Nakagami-m Frequency Selective Fading Channel with Diversity Reception," International Journal of Information and Electronics Engineering vol. 4, no. 1, pp. 67-69, 2014.

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