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General Information
    • ISSN: 2010-3719 (Online)
    • Abbreviated Title: Int. J. Inf. Electron. Eng.
    • Frequency: Quarterly
    • DOI: 10.18178/IJIEE
    • Editor-in-Chief: Prof. Chandratilak De Silva Liyanage
    • Executive Editor: Jennifer Zeng
    • Abstracting/ Indexing : Google Scholar, Electronic Journals Library, Crossref and ProQuest, Ei (INSPEC, IET), EBSCO.
    • E-mail ijiee@ejournal.net
Editor-in-chief

 
University of Brunei Darussalam, Brunei Darussalam   
" It is a great honor to serve as the editor-in-chief of IJIEE. I'll work together with the editorial team. Hopefully, The value of IJIEE will be well recognized among the readers in the related field."

IJIEE 2019 Vol.9(1): 12-18 ISSN: 2010-3719
DOI: 10.18178/IJIEE.2019.9.1.697

Intra and Inter Routing based Lifetime Improvement Method for VFI Network-on-Chip

Ju Sung Kim, Jeong Beom Hong, and Tae Hee Han
Abstract—With the advent of the IoT age, low-power technology inside chips is a prerequisite. As lower power requirements have become important, network-on-chip (NoC) architecture has also begun to adopt design techniques that use a voltage frequency island (VFI), which is a low-power chip design paradigm. While research on maximizing the energy efficiency of NoC in the VFI environment has been performed, studies on the lifetime enhancement of the chip are scarce. In the previous research, the VFI routing scheme allocates a path that minimizes the VFI region change among the shortest paths because it considers only energy. However, if only the routing based on the minimum route is performed, a hotspot occurs owing to the traffic concentration, and the lifetime of the specific link is deteriorated rapidly. We herein propose a routing method that decreases the link failure probability and increases the lifetime in VFI NoC. Our algorithm uses different routing schemes for inter- and intra-communications to distribute traffic as much as possible. The proposed method is a routing method that can optimize energy consumption while focusing on traffic distribution using different routing methods according to each situation. This has resulted in an overall energy efficient load balancing and increased lifetime. The experimental results of mesh topology indicate that the proposed routing method increases the mean time to failure by 31.78% and the energy overhead is 4.45%.

Index Terms—VFI NoC, lifetime improvement method, aging aware routing, LAXY routing.

J. S. Kim is with Department of Electrical and Computer Engineering, Sungkyunkwan University, Suwon, Republic of Korea (e-mail: karlema@skku.edu).
J. B. Hong and T. H. Han are with Department of Semiconductor and Display Engineering, Sungkyunkwan University, Suwon, Republic of Korea, Department of Electrical and Computer Engineering, Sungkyunkwan University, Suwon, Republic of Korea (e-mail: {adfffsa, than}@skku.edu).

[PDF]

Cite: Ju Sung Kim, Jeong Beom Hong, and Tae Hee Han, "Intra and Inter Routing based Lifetime Improvement Method for VFI Network-on-Chip," International Journal of Information and Electronics Engineering vol. 9, no. 1, pp. 12-18, 2019.

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