• Jun 13, 2017 News!The submission for 2018 7th International Conference on Information and Electronics Engineering (ICIEE 2018) is officially open now !   [Click]
  • Oct 20, 2017 News!IJIEE Vol. 7, No. 6 issue has been published online!   [Click]
  • Sep 28, 2017 News!IJIEE Vol. 7, No. 5 issue has been published online!   [Click]
General Information
Editor-in-chief

 
Faculty of Science, University of Brunei Darussalam, Brunei Darussalam   
" It is a great honor to serve as the editor-in-chief of IJIEE. I'll work together with the editorial team. Hopefully, IJIEE will be recognized among the readers in the related field."
IJIEE 2013 Vol.3(1): 13-15 ISSN: 2010-3719
DOI: 10.7763/IJIEE.2013.V3.254

Junctionless CMOS Transistors with Independent Double Gates

A. Kamath, Z. X. Chen, N. Shen, X. Li, N. Singh, G. Q. Lo, and D.-L. Kwong

Abstract—Scaling is getting challenging with every technology node. Implant process requirements for defining conformal junctions in 3D device are very stringent. In addition, defining gate over topography is limited by lithography. Our solution to these problems is a novel junction-less FiNFET like transistor. Unlike conventional FiNFET the gate definition in this device is lithography independent. The fabricated NMOS and PMOS shows good transistor characteristics: ION =52.3uA/um, ION/IOFF ratio = 10 7, SS = 92mV/dec for NMOS and ION =15.4uA/um, ION/IOFF ratio = 10 5, SS = 90mV/dec for PMOS. We also show inverter VTC characteristics fabricated using this NMOS and PMOS.

Index Terms—CMOS, junctionless, independent gates

The authors are with Institute of Microelectronics, A*STAR (Agency for Science, Technology and Research), CO 117685 Singapore (e-mail: kamathar@ime.a-star.edu.sg).

[PDF]

Cite: A. Kamath, Z. X. Chen, N. Shen, X. Li, N. Singh, G. Q. Lo, and D.-L. Kwong, "Junctionless CMOS Transistors with Independent Double Gates," International Journal of Information and Electronics Engineering vol. 3, no. 1, pp. 13-15, 2013.

Copyright © 2008-2017. International Journal of Information and Electronics Engineering. All rights reserved.
E-mail: ijiee@ejournal.net