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General Information
    • ISSN: 2010-3719 (Online)
    • Frequency: Quarterly
    • DOI: 10.18178/IJIEE
    • Editor-in-Chief: Prof. Chandratilak De Silva Liyanage
    • Executive Editor: Jennifer Zeng
    • Abstracting/ Indexing : Google Scholar, Electronic Journals Library, Crossref and ProQuest, Ei (INSPEC, IET), EBSCO.
    • E-mail ijiee@ejournal.net
Editor-in-chief

 
University of Brunei Darussalam, Brunei Darussalam   
" It is a great honor to serve as the editor-in-chief of IJIEE. I'll work together with the editorial team. Hopefully, The value of IJIEE will be well recognized among the readers in the related field."

IJIEE 2014 Vol.4(1): 31-35 ISSN: 2010-3719
DOI: 10.7763/IJIEE.2014.V4.403

Approach of Pulse Parameters Measurement Using Digital IQ Method

R. K. Niranjan and B. Rajendra Naik
Abstract— Electronic Warfare (EW) systems measuring the radar parameters using conventional method can’t preserve phase information of the incoming Radio Frequency (RF) signals. Conventional methods does the measurement using detected video signal or envelope of the RF. Proposed method does the measurement using intermediate frequency (IF) signal which is the down converted signal of RF signal. This method preserves the phase information because the intrapulse and interpulse measurements are carried out using the IF signal. The Matlab simulation is carried out for the intrapulse analysis and results are presented and discussed. The comparison is given between conventional method and proposed method for Radar EW systems.

Index Terms— EW systems, IF signal, intrapulse, interpulse, RF signal.

R. K. Niranjan is with Defence Electronics Research Laboratory (DLRL), Hyderabad (e-mail: niranjanrk2004@gmail.com).
B. Rajendra Naik is with Dept of Electronics and Communication Engineering, College of Engineering, Osmania University, Hyderabad (e-mail: rajendranaikb@gmail.com).

[PDF]

Cite: R. K. Niranjan and B. Rajendra Naik, " Approach of Pulse Parameters Measurement Using Digital IQ Method," International Journal of Information and Electronics Engineering vol. 4, no. 1, pp. 31-35, 2014.

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