Abstract—CV data is one of the most precise forms of information for job seekers (or) employees details about personal, professional and both It manages and maintains any organization securely. Ensuring the security of data is, therefore, critical not only to preserve the data’s of employees’ highly personal information but also to minimize the legal risk to the organization as a whole. When some organizations do not see the full details of the job seekers CV, so for that we have to provide the security for this CV. When an organization takes care of reducing the manual workload, an organization performs; they choose to replace those processes with various levels of security systems. Data Security is the keeping data protected from corruption and unauthorized access and focuses beyond data security is to ensure the privacy while protecting personal or (business) corporate data. This paper will manage the complexity of CV data’s. It's had a various process like employees develop their personal and organizational skills, knowledge, and abilities. Security is of high aspect when it comes to choosing a human resources management system, especially when it means keeping company (corporate) data and the privacy of employee records safe from hackers. Using a method of secure transmission of Encrypting and Decrypting Messages which encrypts the data as it transmits over the job portals with exchanging securely cryptographic keys over a public channel. An important is security is hiding of users particular details. Using NoSQL(MongoDB) for Saving and retrieve our data details.
Index Terms—NoSQL, data security, encryption, hiding of data’s, key generation.
The authors are with Chongqing University of Posts and Telecommunication, China (e-mail: hemn.db85@yahoo.com, linjz@cqupt.edu.cn, ligq@cqupt.edu.cn, mushhad@uaar.edu.pk).
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Cite:Hemn B. Abdalla, Jinzhao Lin, Guoquang Li, and S. Mushhad M Gilani, "NoSQL: Confidential on Data Security and Data Management by Using a Mobile Application," International Journal of Information and Electronics Engineering vol. 6, no. 2, pp. 84-88, 2016.
