Abstract—This work reports a novel scheme for testing and diagnosis of a delay fault in LUT of a cluster based FPGA. The solution is based on implementing a BISTer structure to diagnosis the delay fault of the LUT. The BUT is implemented by chaining k-number of Look-Up Tables (LUT) in specific way. The ORA used a polling scheme to determine the most suitable result and an ATPG will generate the optimum test pattern that will have full test coverage. The entire scheme was implemented and simulated for Virtex-II FPGA .Here the intention was to overcome the drawbacks of previously used method. A design example using the proposed method shows better result. The entire testing scheme can also be applied in On-Line testing environment by using Xilinx Jbits 3.0 API (Application Program Interface) for Xilinx Virtex-II FPGAs.
Index Terms—Delay fault, FPGA, JBits, Look-up table (LUT), Testing.
The authors are with School of VLSI Technology, Bengal Engg. & Science University, Shibpur, India (e-mail: firstname.lastname@example.org, email@example.com, e-mail: firstname.lastname@example.org).
Cite: Nachiketa Das, Hafizur Rahaman, and Indrajit Banerjee, "BIST to Diagnosis Delay Fault in the LUT of Cluster Based FPGA," International Journal of Information and Electronics Engineering vol. 2, no. 2, pp. 269-273, 2012.